Center for Holographic Studies and
Laser micro-mechaTronics (CHSLT)
NanoEngineering, Science, and Technology (NEST)
Mechanical Engineering Department
Worcester, MA 01609-2280
Cosme Furlong
ME-593 / ME-5304. Laser Metrology and Optical NDT
Term C, 2025
DESCRIPTION
In this course, modern laser metrology techniques
are discussed and their practical applications to solve problems, with emphasis
on nondestructive testing (NDT), are illustrated with laboratory
demonstrations. Topics covered include wave and Fourier optics, classic and
holographic interferometry, speckle techniques, solid-state lasers, fiber
optics, CCD cameras, computer vision, camera calibration methods, and image
processing and data reduction algorithms as required in quantitative fringe
analysis. Detail examples of nondestructive testing and coherent optical
metrology in solid mechanics, vibrations, heat transfer, electromagnetics, and
reverse engineering are given.
Students are required to work on projects depending
on their background and interests.
Recommended
background: mechanics, materials,
physics, and knowledge of a high-level computer programming language.
GENERAL
INFORMATION
COURSE No.: ME-593/5304, C'2025
REQUIRED TEXT:
T. Yoshizawa, ed., Handbook of Optical Metrology
CRC Press, 2009
RECOMMENDED
TEXTS:
Th. Kreis, Handbook of Holographic Interferometry
Wiley-VCH, 2005
E. Hecht, Optics, Fourth Edition
Addison Wesley,
2001
LECTURES: M and W, 1:00-2:50 PM, Room
HL-031
LAB MTGs: We will
visit CHSLT Labs (HL-040) during specific lecture times
INSTRUCTOR: C. Furlong
Office: HL-152
Phone: (508) 831-5126
cfurlong@wpi.edu
http://www.wpi.edu/~cfurlong
OFFICE HOURS: TBD (In the meantime: Thursdays from 2:00 to 5:00 PM
or by appointment in HL-152)
CLASS
STRUCTURE
Class will involve a variety of settings
including lecture, small and large group discussions, and laboratory
demonstrations. You are expected to come to every class prepared for an
in-depth discussion of the topics listed on the schedule. Please complete the
relevant readings before coming to class! Reading assignments will be announced
in advance and are based on textbooks and handouts. Because a great deal of the
value gained from this course will revolve around in-class activities, active
attendance and participation during all class periods is expected.
GRADING
The grade for the
course will be based:
25% on homework
25% on midterm exam
50% on project and class discussions
Homework is due
by 1:00 PM on the due date unless otherwise noted. No late homework will be
accepted unless for major reasons.
OUTLINE
|
Date |
Instructors |
Lecture Topic |
Due Dates and Homework
Assignments |
|
Jan 15 W |
CF |
Overview,
Optical Metrology & NDT |
Reading: Ch01: Light Sources
(Yoshizawa) Due: W, Jan 17 Homework: Hwk-Ch0-1 Due: W, Jan 22 |
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Jan 20 M |
|
MLK Holiday |
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Jan 22 W |
CF |
Fundamentals
of Optical Elements and Devices: Light
Sources, Lenses, Prisms, Mirrors |
Course Project: Team list/members due next W, Jan 29 Visit to
CHSLT Laboratories - coming Reading: Ch02: Lenses, Prisms, and
Mirrors (Yoshizawa) Due: M, Jan 27 Homework: Hwk-Ch02-1 Due: W, Jan 29 |
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Jan 27 M |
CF |
Fundamentals
of Optical Elements and Devices: Optoelectronic Sensors, Optical Devices,
Optomechanical Elements |
Visit to CHLST Laboratories Reading: Ch03: Optoelectronic Sensors (Yoshizawa) Due: W, Jan29 Homework: Hwk-Ch03 (proposal) Work on Course Project Proposal(s) Due: M, Feb 03 |
|
Jan 29 W |
CF |
Lect-04: Intro. to CCD/CMOS cameras Intro. to wave optics Fundamentals
of Principles and Techniques for Metrology: Propagation of Light,
Interferometry, Holography |
Individual
presentations of project ideas - coming Reading: Ch04, Ch05, Ch06: Optical Devices, Propagation of Light, &
Interferometry (Yoshizawa) Due: M, Feb 03 Homework: Hwk-Ch03 (proposal) Work on Course Project Proposal(s) Due: M, Feb 03 |
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Feb 03 M |
CF, Students |
Individual presentations of topical project ideas: 10-15 mins
each Note: group presentations/reports will be due M,
Feb 10 |
Submit PPT presentations on Canvas in
advance |
|
Feb 05 W |
CF |
Lect-05: Fundamentals
of Principles and Techniques for Metrology: Speckle Methods, Moire Metrology, Structured Light Projection |
Reading: selected technical papers. Prepare for course discussions: critical review of selected papers
provided by the instructor: Due: W, Feb 12 |
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Feb 10 M |
CF, Students |
Group presentations of topical projects under development: 20-25 mins
each - Progress reports & briefings due Mondays: Feb 17 and Feb 24 - Final reports & presentations due: Wed,
March 05 |
- Written
project proposals, hardcopies and submissions on Canvas,
please. Instructions to prepare topical proposals are posted on Canvas - Submit PPT
presentations on Canvas in advance. One per group. Label files accordingly. |
|
Feb 12 W |
CF, Students |
Critical
review of papers assigned on Feb 05 W |
Reading: selected technical papers. Prepare for course discussions: critical review of selected papers
provided by the instructor. Due: W, Feb 26 |
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Feb 17 M |
CF, Students |
Group presentations: Progress
reports on topical projects under development: 20-25 mins each |
- Written
project reports, hardcopies and submissions on Canvas, please. Instructions
to prepare topical proposals are posted on Canvas - Submit PPT
presentations on Canvas in advance. One per group. Label files
accordingly. |
|
Feb 19 W |
CF, Students |
Special lecture by: Brian Cranton, Former Optical Design Engineer for Google
Inc. Currently Sr. Optical Engineer for Envision Technology, LLC. |
- Prepare a
written summary of the lecture following Appendix A of instructions to
prepare reports as posted on Canvas - Summary due
Wednesday, Feb 26. To be uploaded on Canvas. |
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