Reference List for the AFM Course

Reading Materials

Drafts, to appear in An Introduction to Atomic Force Microscopy, N.A. Burnham, Springer Verlag

FB, Feedback System Response in a Scanning Tunneling Microscope, D. Jeon and R.F. Willis, Rev. Sci. Instrum. 62, 1650-51 (1991)

FFM, Tribological Investigations using Friction Force Microscopy, R. Overney and E. Meyer, pp. 26-34, MRS Bulletin, Volume XVIII, Number 5, May 1993

HLI, Looking at Atoms, N. Burnham, Highlights for Children, pp. 16-17, September 1991

HLII, Stroking Molecules, N. Burnham, Highlights for Children, pp. 16-17, February 2000

IntroAFM, Poster introducing AFM, http://www.wpi.edu/Academics/Depts/Physics/AFM/Pdfs/PosterIntro.pdf

IntroNST, Poster introducing Nano-Science and Technology, http://www2.avs.org/divisions/nstd/Poster.pdf

IWGN, Nanotechnology brochure from the Interagency Working Group on Nanoscience, http://www.wtec.org/loyola/nano/IWGN.Public.Brochure/IWGN.Nanotechnology.Brochure.pdf

MPM, Mechanical Properties of Metals, W.D. Callister, Jr., from Materials Science and Engineering, An Introduction, John Wiley and Sons, New York (2000)

PG, A Practical Guide to Scanning Probe Microscopy, copyright Veeco Instruments, www.veeco.com

SFA, Surface Forces and Adhesion, N.A. Burnham and A.J. Kulik, in Handbook of Micro/Nanotribology, pp. 247-71, B. Bhushan, ed., 2nd edition, CRC Press, Boca Raton, FL, USA (1999)

StiffCal, Comparison of calibration methods for atomic-force microscopy cantilevers, N.A. Burnham et al., Nanotechnology 14, 1-6 (2003)

STM, Basic Principles of Scanning Probe Microscopy, D.A. Bonnell and B.D. Huey, in Scanning Probe Microscopy and Spectroscopy, pp. 7-14, D.A. Bonell, ed., 2nd edition, Wiley-VCH, New York (2001)

Lab Materials

CLI, Computer Lab Instructions, N.A. Burnham

Data sheets for probes and gratings:

Calibration gratings, copyright MikroMasch, www.spmtips.com
Dlevers, rigid cantilevers, copyright Veeco Instruments, www.veeco.com
Ultralevers, compliant cantilevers, copyright Veeco Instruments, www.veeco.com

EXP, Expectations of AFM Users, N.A. Burnham

ICA, I.C. Adams manual, copyright Nanomechanics LLC, www.nanomechanics.com

ILI, Instrument Lab Instructions, N.A. Burnham

ILR, Template for Instrument Lab Reports, N.A. Burnham

LAB5&6.xls, Excel files for Instrument Labs, N.A. Burnham

LP, Laboratory Procedures for the M5 AFM, N.A. Burnham

SPMLab, Software Reference Manual for SPMLab, copyright Veeco Instruments, www.veeco.com

UGI and II, User's Guide for the M5 Instrument, copyright Veeco Instruments, www.veeco.com