Center for Holographic Studies and
Laser micro-mechaTronics (CHSLT)
NanoEngineering, Science, and Technology (NEST)
Mechanical Engineering Department
Worcester, MA 01609-2280
Cosme Furlong
ME-593. Laser Metrology and NDT
Term B’2011
Demands for increased performance and efficiency of components in the nano/micro-, meso-, and macro-scales, impose challenges to their engineering design, study, and optimization. These challenges are compounded by multidisciplinary applications to be developed inexpensively in short time while satisfying stringent design objectives. As a consequence, effective quantitative engineering methodologies, such as optical techniques, are used in the study and optimization of components. State-of-the-art optical techniques are based on the detailed investigation of light interacting with materials, which enables accurate and precise measurements about the state of an object or medium of interest, such as size, shape, temperature, velocity, density, or state of stress and strain. Such measurements are of significant importance in many areas of engineering and science, which include solid mechanics, vibrations, tribology, transport phenomena (heat, mass, and momentum transfer), acoustics, and electromagnetism.
In this course, modern laser metrology techniques are discussed and their practical applications to solve problems, with emphasis on nondestructive testing (NDT), are illustrated with laboratory demonstrations. Topics covered include wave and Fourier optics, classic and holographic interferometry, speckle techniques, solid-state lasers, fiber optics, CCD cameras, computer vision, camera calibration methods, and image processing and data reduction algorithms as required in quantitative fringe analysis. Detail examples of nondestructive testing and coherent optical metrology in solid mechanics, vibrations, heat transfer, electromagnetics, and reverse engineering are given.
Students are required to work on projects depending on their background and interests.
Recommended background: mechanics, materials, physics, knowledge of a high-level computer programming language.
GENERAL
INFORMATION
COURSE No.:
ME-593, B’2011
REQUIRED TEXT: T. Yoshizawa, ed., Handbook of Optical Metrology
CRC Press, 2009
RECOMMENDED
TEXTS: ● Th. Kreis, Handbook of Holographic Interferometry
Wiley-VCH, 2005
● E. Hecht, Optics, Fourth Edition
Addison
Wesley, 2001
LECTURES:
M and W, 5:00-6:50 PM, Room HL-218
LAB MTGs:
We will visit CHSLT Labs (HL-040) during specific lecture times
INSTRUCTOR: C. Furlong
Office: HL-151
Phone: (508) 831-5126
cfurlong@wpi.edu
http://www.wpi.edu/~cfurlong
OFFICE HOURS: Tuesday
from 2:00 to 5:00 PM or by appointment (in HL-151).
CLASS
STRUCTURE
Class will involve a variety of settings including lecture, small and large group discussions, and laboratory demonstrations. You are expected to come to every class prepared for an in-depth discussion of the topics listed on the schedule. You must have completed the relevant readings before coming to class! Reading assignments will be announced in advanced and are based on textbooks and handouts. Because a great deal of the value gained from this course will revolve around in-class activities, active attendance and participation during all class periods is expected.
GRADING
The grade for the course will be based: 30% on homework (5)
20% on midterm exam
50% on project and class discussions
Homework is due by 5PM on the due date unless otherwise noted. No late homework will be accepted.
OUTLINE
|
Date |
Instructor |
Lecture Topic |
Due Dates |
|
Oct 26 W |
CF |
Overview,
Optical Metrology & NDT |
|
|
|
|
|
|
|
Oct 31 M |
CF |
Fundamentals of
Optical Elements and Devices: Light
Sources, Lenses, Prisms, Mirrors |
|
|
Nov 2 W |
CF |
Fundamentals of
Optical Elements and Devices: Optoelectronic
Sensors, Optical Devices, Optomechanical Elements |
|
|
|
|
|
|
|
Nov 7 M |
CF |
Lect-04: Fundamentals of
Principles and Techniques for Metrology: Propagation
of Light, Interferometry, Holography |
|
|
Nov 9 W |
CF |
Lect-05: Fundamentals of
Principles and Techniques for Metrology: Speckle Methods, Moiré Metrology |
HW 1 Due Draft Paper
Summary Due |
|
|
|
|
|
|
Nov 14 M |
CF |
Lect-06 & Fundamentals of
Principles and Techniques for Metrology: Microscopy,
White-light Interferometry, Near-field
Optics |
|
|
Nov 16 W |
CF |
Lect-07 Fundamentals of
Principles and Techniques for Metrology: Fringe
Analysis, Phase Unwrapping |
HW 2 Due |
|
|
|
|
|
|
Nov 21 M |
CF |
Lect-08 MIDTERM EXAM |
|
|
|
|
Thanksgiving break |
|
|
|
|
|
|
|
Nov 28 M |
CF, Students |
Lect-09 Applications. Class Discussions: Displacements & Deformations |
HW 3 Due |
|
Nov 30 W |
CF, Students |
Lect-10 Applications. Class Discussions: Displacements & Deformations |
Draft Paper Due |
|
|
|
|
|
|
Dec 5 M |
CF, Students |
Applications. Class Discussions: Contouring, 3D Shape, Profilometry |
HW 4 Due |
|
Dec 7 W |
CF, Students |
Applications. Class Discussions: Shearography & Related Techniques |
|
|
|
|
|
|
|
Dec 12 M |
CF, Students |
Applications. Class Discussions: Thin-Films, MEMS, MOEMS, DIC |
HW 5 Due |
|
Dec 14 W |
Students |
Student Paper
Presentation Session |
Final Paper Due |
